Circuit model for slotline-to-coplanar waveguide asymmetrical transitions - Electronics Letters

When the control unit detects the diagnose input sequence, it sets the DCR (p, = 1 for all 0, and drives the architecture to the DTM by setting NIT = 0 and TID = 0. This switches the MUX driving To,, to the DCR output therefore driving the external output to a logic 1, to signal that the device is in DTM (see Fig. 2). The control unit then sets the DCR to the shift mode, starting a partition identification sequence that serially passes a single 0 through the DCR during n cycles using pm. The DCR sequence passes all DCVs from D, to D, into the DCR, measuring the quiescent current through each partition separately (when the DCV D, is in the DCR, only the partition P, is sensed by the BIC sensor). The DCR is in the shift mode when the CUT enters DTM until the BIC sensor output goes high and stops the shift process. The BIC sensor output will go high when the partition passing the elevated quiescent current is monitored by the sensor, given that the test vector T that activated the defect in the NTM is driving the CUT inputs. The DCV in the DCR (0,) when the BIC sensor output is activated identifies partition P, as the partition which increases the quiescent current. When this happens, the BIC sensor output stops shifting the DCR. After n cycles of the partition identifying sequence, the control unit resets the BIC sensor and shifts out the DCR contents. A total of n additional clock cycles are required to completely shift out the DCV that identifies the partition passing the elevated quiescent current.